Optical properties of silicon doped ZnO
Creators
- 1. Multidisciplinary Nanotechnology Centre, Swansea University, Swansea SA2 8PP (United Kingdom)
Description
We have calculated the optical structure of wurtzite ZnO doped with Silicon (Si). The calculations are based on the density functional theory with the generalized gradient approximation (GGA) and the projector augmented wave pseudopotentials. The GGA with the Perdew Burke Ernzerhof exchange-correlation functional are employed in the simulations. Ultrasoft pseudopotentials are utilized for the geometry optimization to render the computations tractable as well as to enhance the efficiency. We investigate two kinds of defects in ZnO, namely the substitution of Zn by Si and O by Si. The optical properties, including dielectric function, reflectivity and absorption coefficient of wurtzite ZnO are calculated. The variation in the band gap and energetics have been validated against published results. The dielectric properties follow a steep decreasing trend for the low energy level. In addition, the reflectivity and absorption coefficients reduce abruptly due to the doping.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2010.08.072Additional details
Identifiers
- DOI
- 10.1016/j.physb.2010.08.072;
- PII
- S0921-4526(10)00851-3;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 405
- Journal Issue
- 23
- Journal Page Range
- p. 4763-4767
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42071934
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION; APPROXIMATIONS; COMPUTERIZED SIMULATION; DENSITY FUNCTIONAL METHOD; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DOPED MATERIALS; EFFICIENCY; ENERGY LEVELS; POINT DEFECTS; REFLECTIVITY; SILICON ADDITIONS; ZINC OXIDES
- Descriptors DEC
- ALLOYS; CALCULATION METHODS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRICAL PROPERTIES; MATERIALS; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SILICON ALLOYS; SIMULATION; SORPTION; SURFACE PROPERTIES; VARIATIONAL METHODS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.