Published 1972
| Version v1
Journal article
Analysis of monomolecular layers of solids by the static method of secondary ion mass spectroscopy (SIMS)
Creators
- 1. Physikalisches Institut der Universitaet zu Koeln, Koeln (BRD)
Description
no abstract available
Additional details
Identifiers
- DOI
- 10.1007/bf02520979;
Publishing Information
- Journal Title
- Journal of Radioanalytical Chemistry
- Journal Volume
- 12
- Journal Issue
- 2
- Series
- J. Radioanal. Chem.
- Journal Page Range
- 95-99
- ISSN
- 0134-0719
INIS
- Country of Publication
- Hungary
- Country of Input or Organization
- Hungary
- INIS RN
- 5111907
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S42: ENGINEERING;
- Descriptors DEI
- ALUMINIUM OXIDES; COMPARATIVE EVALUATIONS; CRYSTAL STRUCTURE; DEPTH; ION BEAMS; LAYERS; MASS SPECTROSCOPY; MOLYBDENUM; QUANTITATIVE CHEMICAL ANALYSIS; SECONDARY BEAMS; SENSITIVITY; SOLIDS; SURFACES
- Descriptors DEC
- ALUMINIUM COMPOUNDS; BEAMS; CHALCOGENIDES; CHEMICAL ANALYSIS; DIMENSIONS; ELEMENTS; METALS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Notes
- 4 figs.; 6 refs.; Updated automatically by Metadata and Full-Text Enrichment Agent