TEM observation of stress-induced martensite after nanoindentation of pseudoelastic Ti50Ni48Fe2
Creators
- 1. Institut fuer Werkstoffe, Ruhr-Universitaet Bochum, D-44801 Bochum (Germany)
Description
In the present study we show that stress-induced martensite forms during nanoindentation of a pseudoelastic shape memory alloy of type Ti50Ni48Fe2. For this purpose, we performed nanoindentation experiments using a specimen which was prepared for subsequent investigation in a transmission electron microscope (TEM). A Berkovich nanoindentation experiment into the thin part of the TEM specimen and subsequent post-mortem TEM analysis (bright field and selected area diffraction) showed that B19' forms close to the center of the indent (distance d from the center of the indent <2 μm). Further out (2 μm < d < 5 μm), an increased dislocation density was observed. This represents direct microstructural evidence for the formation of stress-induced martensite and a simultaneous increase in dislocation density during Berkovich nanoindentation of pseudoelastic shape memory alloys
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2007.12.012Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2007.12.012;
- PII
- S1359-6462(07)00886-X;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 58
- Journal Issue
- 9
- Journal Page Range
- p. 743-746
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39067960
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DIFFRACTION; DISLOCATIONS; MARTENSITE; MICROSTRUCTURE; NICKEL ALLOYS; PLASTICITY; SHAPE MEMORY EFFECT; STRESSES; TITANIUM ALLOYS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; IRON ALLOYS; LINE DEFECTS; MECHANICAL PROPERTIES; MICROSCOPY; SCATTERING; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.