Published 1982
| Version v1
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Study on Nb-H system by scanning electron microscope and transmission electron microscope
Creators
- 1. Sao Paulo Univ., Sao Carlos (Brazil). Inst. de Fisica e Quimica
- 2. Sao Carlos Univ. (Brazil). Dept. de Engenharia de Materiais
Description
The microstructures of Nb-H system have been studied using TEM for three hydrogen concentrations; i.e. C sub(H) = 400, 600 and 5000 ppm by weight. The results are analysed to interpret the variation of line resolution of Electron Channeling Patterns of Nb-H, obtained in SEM by the Selected Area Diffraction (SAD) technique, as a function of hydrogen concentration. Finally, the SAD technique has been used to estimate the evolution of strain field in Nb-H (C sub(H) = 760 ppm) with isochronal annealing. (Author)
Availability note (English)
MF available from INIS under the Report Number.Abstract (Portuguese)
As microestruturas do sistema Nb-H foram estudadas usando MET para tres concentracoes de hidrogenio, ou seja C sub(H) = 400, 600 e 5000 ppm em peso. Os resultados foram utilizados para interpretar a variacao da resolucao de linha do Diagrama de Tunelagem de Eletrons do sistema Nb-H, obtido em MEV atraves da tecnica de Difracao em Area Selecionada (DAS), como funcao da concentracao de hidrogenio. Finalmente, pela tecnica de DAS, estimou-se a evolucao produzida no campo de deformacao por recozimento isocronico em Nb-H (C sub(H) = 760 ppm). (Autor)Files
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Additional details
Additional titles
- Original title (Portuguese)
- Estudo do sistema Nb-H por microscopia eletronica de varredura e transmissao
Publishing Information
- Imprint Pagination
- 9 p.
- Report number
- INIS-BR--51
Conference
- Title
- 5. Brazilian Congress on Materials Science and Engineering.
- Dates
- 13-15 Dec 1982.
- Place
- Porto Alegre, RS (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 14771225
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; HYDROGEN; MICROSTRUCTURE; NIOBIUM; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCO
- Descriptors DEC
- CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; ELEMENTS; HEAT TREATMENTS; METALS; MICROSCOPY; NONMETALS; TRANSITION ELEMENTS