Published November 1988 | Version v1
Journal article

Criteria and principles of optimization of concentrating electron-optical systems

Description

Approach to optimization of concentrating electron-optical systems (EOS), forming beams of ''electron probe'' type is suggested. Such beams are widely used for electron-beam welding, thermal cutting and electron-beam surface modification of materials. Main purposes,pursued when designing and optimizing technological EOS for these processes, lie in achieving the maximal electron luminosity and length of a region (active region), where power density exceeds the certain critical value

Additional details

Additional titles

Original title (Russian)
Критерии и принципы оптимизации концентрирующих электронно оптических систем

Publishing Information

Journal Title
Zhurnal Tekhnicheskoj Fiziki
Journal Volume
58
Journal Issue
11
Series
Zh. Tekh. Fiz.
Journal Page Range
2063-2068
ISSN
0044-4642
CODEN
ZTEFA

INIS

Country of Publication
Russian Federation
Country of Input or Organization
USSR
INIS RN
20042160
Subject category
S43: PARTICLE ACCELERATORS;
Descriptors DEI
ALGORITHMS; BEAM EMITTANCE; BEAM OPTICS; ELECTRON BEAMS; ELECTRON GUNS; FOCUSING; OPTIMIZATION; SPACE CHARGE
Descriptors DEC
BEAMS; LEPTON BEAMS; PARTICLE BEAMS