A family of smoothing algorithms for electron and other spectroscopies based on the Chebyshev filter
- 1. Instituto de Ciencia de Materiales, Consejo Superior de Investigaciones Cientificas, Campus de Cantoblanco 28049-Madrid (Spain)
- 2. Departamento de Fisica Aplicada, Facultad de Ciencias, C-XII, Universidad Autonoma de Madrid, Cantoblanco. 28049-Madrid (Spain)
Description
Smoothing is a useful tool to improve the signal-to-noise ratio of spectroscopic data. This paper reports a new family of smoothing formulas, the Chebyshev filters, which are derived approaching the original data to a polynomial and using the mini-max principle, that is, keeping the maximum error down to a minimum, as fitting criterion. The properties of the filters are studied analyzing their associated transfer functions in the frequency domain. This leads us to the concept of spectral window and spectral window width as tool and parameter, respectively, to remove the high frequency noise components accompanying the experimental data. Also, simple criteria to choose the appropriate width of the spectral windows are put forward. The behaviour of the filters is easy to understand and the filters are fast and simple to use and to program. Finally the proposed smoothing algorithms have been tested using synthetic data as well as X-ray photoelectron spectra and optical absorption spectra
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2006.01.024;
- PII
- S0040-6090(06)00127-1;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 513
- Journal Issue
- 1-2
- Journal Page Range
- p. 72-77
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38055570
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION SPECTRA; ABSORPTION SPECTROSCOPY; FILTERS; POLYNOMIALS; SIGNAL-TO-NOISE RATIO; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- DIMENSIONLESS NUMBERS; ELECTRON SPECTROSCOPY; FUNCTIONS; PHOTOELECTRON SPECTROSCOPY; SPECTRA; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.