Published September 13, 2004 | Version v1
Report Metadata-only

An assessment of yttrium optical constants in the EUV using Mo/Y multilayers designed as linear polarizers

Creators

Description

We have produced and characterized Mo/Y multilayers designed as linear-polarizers for use near λ ∼ 8 nm. By depositing these films directly onto silicon photodiodes, we are able to measure both reflectance and transmittance in the EUV using synchrotron radiation. These measurements have been used to access the accuracy of yttrium optical constants in this wavelength range. We describe our experimental results and discuss the prospects for the future development of efficient EUV polarization elements

Availability note (English)

Available from http://www.llnl.gov/tid/lof/documents/pdf/311664.pdf; PURL: https://www.osti.gov/servlets/purl/15014553-qNclTk/native/

Additional details

Identifiers

URL
http://www.llnl.gov/tid/lof/documents/pdf/311664.pdf; https://www.osti.gov/servlets/purl/15014553-qNclTk/native/;

Publishing Information

Imprint Pagination
8 p.
Report number
UCRL-PROC--206645

Conference

Title
Optical Constants of Materials from UV to X-ray Wavelengths
Dates
4-5 Aug 2004
Place
Denver, CO (United States)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
39020096
Subject category
S36: MATERIALS SCIENCE; S43: PARTICLE ACCELERATORS; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
ACCURACY; PHOTODIODES; POLARIZATION; SILICON; SYNCHROTRON RADIATION; WAVELENGTHS; YTTRIUM
Descriptors DEC
BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ELEMENTS; METALS; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMIMETALS; TRANSITION ELEMENTS

Optional Information

Contract/Grant/Project number
W-7405-ENG-48
Notes
PDF-FILE: 8 ; SIZE: 0.4 MBYTES
Funding organization
US Department of Energy (United States)