Published April 15, 2019 | Version v1
Journal article

Structural and magnetic study of Sm doped NiFe2O4 nanoparticles

  • 1. Atomic Energy Authority, Reactor Physics Department, Nuclear Research Center (Egypt)

Description

NiFe2−xSmxO4 (x = 0.0, 0.01, 0.025, 0.05, 0.075, 0.1) nanoferrites samples were prepared by sol–gel method. The structural properties of the samples were studied by X-ray powder diffraction, where the formation of a cubic spinel phase was confirmed. The lattice parameter and the particle size were determined by applying Rietveld refinement. A slight change in the lattice parameter was observed for Sm doped nanosamples. Whereas, the particle sizes were found to decrease with increasing Sm concentration (x) and have the highest value (42 nm) for pure NiFe2O4 nanoparticles. The magnetic properties were characterized using Mössbauer effect (ME) spectroscopy and vibrating sample magnetometer (VSM). ME spectroscopy was used to study the distribution of cations in tetrahedral (A) and octahedral [B] sites of the nanoparticles and the degrees of inversion values were obtained. The saturation magnetization, coercivity and remanent magnetization were determined using VSM measurements. These magnetic parameters vary with Sm substitution and found to be mainly affected by the change in the cations distribution and particle sizes.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Materials Science. Materials in Electronics
Journal Volume
30
Journal Issue
7
Journal Page Range
p. 6768-6775
ISSN
0957-4522
CODEN
JSMEEV

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52019362
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
COERCIVE FORCE; DOPED MATERIALS; LATTICE PARAMETERS; MAGNETIC PROPERTIES; MAGNETIZATION; NANOPARTICLES; PARTICLE SIZE; VIBRATING SAMPLE MAGNETOMETERS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; MAGNETOMETERS; MATERIALS; MEASURING INSTRUMENTS; PARTICLES; PHYSICAL PROPERTIES; SCATTERING; SIZE

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Copyright
Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature