Published May 7, 2007 | Version v1
Journal article Metadata-only

Initial study on the structure and optical properties of Zn1-xFe xO films

Creators

  • 1. Key Laboratory of Thin Films of Jiangsu, Suzhou university, Suzhou 215006 (China)
  • 2. Department of Physics, Suzhou University, Suzhou 215006 (China)
  • 3. Key Laboratory of Thin Films of Jiangsu, Suzhou university, Suzhou 215006 (China) and Analysis and Testing Center, Suzhou University, Suzhou 215006 (China)
  • 4. Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031 (China)

Description

Zn1-xFe xO (x = 0, 0.052, 0.103, 0.157 and 0.212) films were prepared by the radio-frequency magnetron sputtering technique on Si (111) substrates and the microstructure of which was characterized by X-ray diffraction, X-ray photoelectron spectroscopy, and scanning electron microscopy. The samples had a preferential c-axis orientation and the position of (002) diffraction peak shifted to the lower degree side with increasing Fe component. In order to investigate the optical transmittance properties of Zn1-xFe xO films, we prepared the films on Al2O3 (001) substrates simultaneity and the UV-VIS optical transmittance spectra showed that the band gap energy of Zn1-xFe xO films decreased with increase of Fe concentration. Photoluminescence spectra of the samples were observed at room temperature

Additional details

Identifiers

DOI
10.1016/j.tsf.2007.01.015;
PII
S0040-6090(07)00034-X;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
515
Journal Issue
13
Journal Page Range
p. 5462-5465
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39018792
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALUMINIUM OXIDES; DOPED MATERIALS; FILMS; IRON OXIDES; MAGNETRONS; MICROSTRUCTURE; OPTICAL PROPERTIES; ORIENTATION; PHOTOLUMINESCENCE; RADIOWAVE RADIATION; SCANNING ELECTRON MICROSCOPY; SPECTRA; SPUTTERING; TEMPERATURE RANGE 0273-0400 K; TRANSMISSION; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDES
Descriptors DEC
ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EMISSION; EQUIPMENT; IRON COMPOUNDS; LUMINESCENCE; MATERIALS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHOTON EMISSION; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SPECTROSCOPY; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; ZINC COMPOUNDS

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.