Ion assisted near-complete filling of high aspect ratio trenches for 3-D neutron detectors
- 1. Semiconductor Thin Films and Plasma Processing Laboratory, Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology Bombay, Powai, Mumbai – 400076 (India)
- 2. Electronics Division, Bhabha Atomic Research Centre, Trombay, Mumbai – 400085 (India)
Description
Highlights: • Development of plasma enhanced chemical vapor deposition system. • Forward directed ions aid conformal filling of BxC into high aspect ratio trench. • 94.25% fill factor and 88.25% conformal coverage ratio at 3:7 ar/he flow ratio. • Promising for fabrication of high efficiency neutron detector. A single-step process has been developed for the conformal deposition of boron carbide in high aspect ratio trenches fabricated in an n-type (111) silicon substrate. Plasma enhanced chemical vapor deposition was used to deposit boron carbide from ortho-carborane (OC2B10H12) precursor mixed with helium and argon gas. The depositions were carried out under substrate self-bias conditions to achieve a high fill factor using forward-directed ions. Nearly complete filling of 25 µm deep trenches with high-aspect ratio (> 6:1) via conformal coating of side walls has been confirmed from cross-sectional scanning electron microscopy studies. The results presented in this article establish that the process technology developed for achieving conformal deposition of the neutron stopping layer is suitable for the fabrication of Silicon p-i-n based three-dimensional thermal neutron detectors with high neutron detection efficiency.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2021.138521Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2021.138521;
- PII
- S0040609021000043;
Publishing Information
- Journal Title
- Thin Solid Films (Print)
- Journal Volume
- 720
- Journal Page Range
- vp.
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54005155
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ARGON; ASPECT RATIO; BORON CARBIDES; CARBORANES; CHEMICAL VAPOR DEPOSITION; FABRICATION; FILL FACTORS; HELIUM; NEUTRON DETECTION; NEUTRON DETECTORS; SCANNING ELECTRON MICROSCOPY; SILICON; THERMAL NEUTRONS
- Descriptors DEC
- BARYONS; BORON COMPOUNDS; CARBIDES; CARBON COMPOUNDS; CHEMICAL COATING; DEPOSITION; DETECTION; DIMENSIONLESS NUMBERS; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; FLUIDS; GASES; HADRONS; MEASURING INSTRUMENTS; MICROSCOPY; NEUTRONS; NONMETALS; NUCLEONS; ORGANIC BORON COMPOUNDS; ORGANIC COMPOUNDS; RADIATION DETECTION; RADIATION DETECTORS; RARE GASES; SEMIMETALS; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2021 Elsevier B.V. All rights reserved.