Published August 2008 | Version v1
Journal article

Etching characteristic for tracks of multicharged ions in polymer

  • 1. Institute of Heavy Ion Physics, State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871 (China)

Description

Multicharged ions (Agq+, Cuq+, Siq+, q=1,2,3) at constant speed ∼vBohr (Bohr velocity) were used to irradiate PC (polycarbonate) foils which were subsequently chemically etched. Because of the low ion dose of <108ions/cm2, pores on the surface were discrete. The diameters of the pores were measured by means of scanning electron microscopy (SEM). From the linear dependence of the pore diameter on the etching time, the transversal etching rate can be obtained. It was found that the transversal etching rate decreased with ion charge. These results can mainly be explained by the variation of the charge exchange process for ions with a different charge state

Availability note (English)

Available from http://dx.doi.org/10.1016/j.radmeas.2008.04.073

Additional details

Identifiers

DOI
10.1016/j.radmeas.2008.04.073;
PII
S1350-4487(08)00211-4;

Publishing Information

Journal Title
Radiation Measurements
Journal Volume
43
Journal Issue
suppl.1
Journal Page Range
p. S111-S115
ISSN
1350-4487
CODEN
RMEAEP

Conference

Title
23. international conference on nuclear tracks in solids
Dates
11-15 Sep 2006
Place
Beijing (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40008256
Subject category
S61: RADIATION PROTECTION AND DOSIMETRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGE EXCHANGE; CHARGE STATES; ENERGY LOSSES; ETCHING; MULTICHARGED IONS; PARTICLE TRACKS; POLYCARBONATES; RADIATION DOSES; SCANNING ELECTRON MICROSCOPY
Descriptors DEC
CARBON COMPOUNDS; CARBONATES; CHARGED PARTICLES; DOSES; ELECTRON MICROSCOPY; IONS; LOSSES; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXYGEN COMPOUNDS; POLYMERS; SURFACE FINISHING

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.