Published April 1, 2006 | Version v1
Journal article

Hydrogen/Deuterium-defect complexes involved in the ion cutting of Si (0 0 1) at the sub-100 nm scale

  • 1. Department of Applied Physics and Physico-Informatics, Keio University, 3-14-1, Hiyoshi, Kohoko-ku, Yokohama, 223-8522 (Japan)
  • 2. INRS-EMT, Universite du Quebec, Varennes (Quebec) (Canada)
  • 3. Department de Physique, Universite de Montreal, Montreal (Quebec) (Canada)
  • 4. Department of Physics and Astronomy, University of Western Ontario, London (Canada)
  • 5. Institut fuer Festkoerperelektronik, Technische Universitaet Vienna (Austria)
  • 6. Institut fuer Festkoerperelektronik, Technische Universitaet Wien (Austria)

Description

We studied the thermal evolution of H/D-stabilized defects aiming at understanding the microscopic mechanisms leading to crystalline silicon surface blistering and exfoliation. The critical hydrogen-defect complexes involved in this phenomenon have been identified by Raman spectroscopy analysis. A plausible mechanism for the ion-cut process emerging from our analyses is proposed. Surprising but instructive effects observed under isotope substitution are also discussed

Additional details

Identifiers

DOI
10.1016/j.physb.2005.12.011;
PII
S0921-4526(05)01400-6;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
376-377
Journal Page Range
p. 36-40
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
23. international conference on defects in semiconductors
Dates
24-29 Jul 2005
Place
Awaji Island (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37073060
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPLEXES; DEUTERIUM; HYDROGEN; ISOTOPE EFFECTS; POINT DEFECTS; RAMAN SPECTROSCOPY; SILICON; SILICON IONS; SURFACES
Descriptors DEC
CHARGED PARTICLES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; HYDROGEN ISOTOPES; IONS; ISOTOPES; LASER SPECTROSCOPY; LIGHT NUCLEI; NONMETALS; NUCLEI; ODD-ODD NUCLEI; SEMIMETALS; SPECTROSCOPY; STABLE ISOTOPES

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.