Computational Kerr ellipsometry: Quantifying broadband optical nonreciprocity of magneto-optic materials
Creators
- 1. Max Planck Institute for the Science of Light, Staudtstraße 2, 91058 Erlangen, Germany
- 2. Birck Nanotechnology Center, Elmore Family School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, USA
- 3. Department of Fundamental Sciences and Engineering, Sivas University of Science and Technology, Sivas, Turkey
- 4. INESC Microsistemas e Nanotecnologias, Rua Alves Redol, 9, 1000-029 Lisboa, Portugal
- 5. Instituto Superior Tecnico, Universidade de Lisboa, Avenida Rovisco Pais, 1000 Lisboa, Portugal
- 6. Centre for Nano Science and Engineering, Indian Institute of Science, Bengaluru 560012, India
Description
Characterizing the optical response of magneto-optic and magnetic materials usually relies on semiclassical models (e.g., Lorentz oscillator model) involving few parameters or models based on a detailed quantum mechanical description of the underlying response. These models typically involve a few parameters that are estimated via fitting the experimental data to provide a qualitative understanding of the underlying physics. Such a few-parameters fitting approach falls short of accurately capturing all elements of the complex-valued permittivity tensor across a range of wavelengths. Accurate characterization of the permittivity tensor elements across a broad range of wavelengths is invariably imperative for designing optical elements such as isolators, circulators, etc. Here, we propose and demonstrate a ubiquitous and accessible method based on a combination of spectroscopic ellipsometry and spectroscopic magneto-optic Kerr effect (MOKE) measurements coupled with rigorous numerical parameter extraction techniques. To this end, we use the combined MOKE ellipsometry measurements conducted at different angles of incidence with a gradient-descent minimization algorithm to provide the inverse solution to the complete dielectric permittivity tensor. Further, we demonstrate model reverification to ensure the estimated dielectric permittivity values reliably predict the measured experimental data. Our method is a simplified bench-top counterpart to the otherwise complex measurement systems.
Additional details
Identifiers
- DOI
- 10.1103/PhysRevB.109.054433;
- Crossref Funder ID
- 10.13039/501100001843; 10.13039/100000015; 10.13039/100006151; 10.13039/501100001871;
Publishing Information
- Journal Title
- Physical Review B
- Journal Volume
- 109
- Journal Issue
- 5
- Journal Page Range
- 7 pgs.
- ISSN
- 1550-235X
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S97: MATHEMATICAL METHODS AND COMPUTING;
- Descriptors DEI
- ALGORITHMS; DIELECTRIC MATERIALS; ELLIPSOMETERS; ELLIPSOMETRY; EXPERIMENTAL DATA; MAGNETIC MATERIALS; MATHEMATICAL SOLUTIONS; MINIMIZATION; NONLINEAR OPTICS; OPTICS; OSCILLATORS; PERMITTIVITY; QUANTUM MECHANICS; SEMICLASSICAL APPROXIMATION; TENSORS; WAVELENGTHS
- Descriptors DEC
- APPROXIMATIONS; CALCULATION METHODS; DATA; DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; ELECTRONIC EQUIPMENT; EQUIPMENT; INFORMATION; MATERIALS; MATHEMATICAL LOGIC; MEASURING INSTRUMENTS; MEASURING METHODS; MECHANICS; NUMERICAL DATA; OPTICS; OPTIMIZATION; PHYSICAL PROPERTIES; POLARIMETERS
Optional Information
- Copyright
- ©2024 American Physical Society
- Contract/Grant/Project number
- DE-SC0017717; DE-SC0017717; UID/05367/2020
- Notes
- Contact Email: Corresponding author: supradeepa@iisc.ac.in; Contact Email: Corresponding author: zjacob@purdue.edu; Record automatically processed
- Funding organization
- Science and Engineering Research Board; U.S. Department of Energy; Basic Energy Sciences; Fundação para a Ciência e a Tecnologia