Published June 1994
| Version v1
Journal article
Analysis of surface layers and volume of solids by slow electron emission spectra. Communication 1. Sensitivity of spectra to surface state
- 1. Rostovskij-na-Donu Gosudarstvennyj Univ., Rostov-na-Donu (Russian Federation). Nauchno-Issledovatel'skij Inst. Fiziki
Description
An attempt is made to use slow electron spectra excited by soft X radiation (1-3 KeV) for analysis of metal surface state. Experiments were carried out on tantalum specimens with oxidized surfaces after various treatments as well as on copper films with nonoxidized surface. The technique is proposed that allows one to take low electron spectra and to separate a contribution of the surface in itself from that of more deep layers (20-30 A). 17 refs., 3 figs
Additional details
Additional titles
- Original title (Russian)
- Анализ поверхностных слоев и обьема твердого тела по спеcтрам эмиссии медленных электронов. 1. Чувствительност' спектров к состоянию поверхности
Publishing Information
- Journal Title
- Fizika Metallov i Metallovedenie
- Journal Volume
- 77
- Journal Issue
- 6
- Journal Page Range
- p. 109-117.
- ISSN
- 0015-3230
- CODEN
- FMMEA9
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 26054060
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- COPPER; ELECTRON SPECTRA; ELECTRON SPECTROSCOPY; MICROSTRUCTURE; SOLIDS; SURFACES; TANTALUM
- Descriptors DEC
- CRYSTAL STRUCTURE; ELEMENTS; METALS; SPECTRA; SPECTROSCOPY; TRANSITION ELEMENTS