Microstructure and mechanical behavior of annealed MP35N alloy wire
- 1. Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology Bombay, Powai, Mumbai 400076 (India)
- 2. School of Engineering, Brown University, Providence, RI 02912 (United States)
- 3. Medtronic, PLC, USA, Science and Technology, Minneapolis, MN 55432 (United States)
Description
In a previous paper, the microstructure, monotonic, and cyclic response of as-drawn ~100 μm diameter MP35N low-Ti alloy wire were presented and discussed. In this sequel paper, the effects of annealing the same cold-drawn wire on microstructure and mechanical properties are examined. Specifically, segments of the wire were annealed for 1 h at 973 K, 1023 K, 1073 K, 1123 K and 1173 K in a vacuum furnace. The resulting microstructure was characterized by SEM, EBSD and TEM and compared to the as-drawn microstructure. In-situ heating in the TEM of MP35N ribbon in a similarly cold worked condition enabled corroboration of microstructure evolution during annealing. Annealed wires were tested monotonically and cyclically in uniaxial tension at room temperature, the latter using a stress ratio (R) of 0.3. In addition, the annealed wires were tested cyclically at R=−1 using the rotating beam bending fatigue test. Post-deformation structures and fracture surfaces were characterized using TEM and SEM respectively. Annealing the cold drawn wire results in recrystallization and grain growth; the extent is dependent on the annealing temperature. Deformation twin boundaries in the as-drawn structure illustrate faceted bulging and eventually complete elimination, the microstructure evolving into fine equiaxed grains containing coarser annealing twins with no significant change in texture. Yield strength decreases rapidly with recrystallization to almost half the value of the as-drawn condition, but is accompanied by an increase in modulus (by ~25%) and tensile elongation reaching ~30%. Cyclic response by the way of S–N curves is not enhanced by annealing on an absolute stress scale (due to the loss in yield strength) although the annealed wires are cyclically superior when the stress data are normalized by yield stress
Availability note (English)
Available from http://dx.doi.org/10.1016/j.msea.2015.03.103Additional details
Identifiers
- DOI
- 10.1016/j.msea.2015.03.103;
- PII
- S0921-5093(15)00363-9;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 636
- Journal Page Range
- p. 340-351
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47044814
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOY-MP35N; ANNEALING; BACKSCATTERING; ELECTRON DIFFRACTION; ELONGATION; FRACTURES; GRAIN GROWTH; HEATING; MICROSTRUCTURE; RECRYSTALLIZATION; SCANNING ELECTRON MICROSCOPY; STRESSES; SURFACES; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 1000-4000 K; TEXTURE; TRANSMISSION ELECTRON MICROSCOPY; WIRES; YIELD STRENGTH
- Descriptors DEC
- ALLOYS; CHROMIUM ALLOYS; COBALT ALLOYS; COHERENT SCATTERING; DEFORMATION; DIFFRACTION; ELECTRON MICROSCOPY; FAILURES; HEAT TREATMENTS; MECHANICAL PROPERTIES; MICROSCOPY; MOLYBDENUM ALLOYS; NICKEL ALLOYS; SCATTERING; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.