Published May 2004
| Version v1
Journal article
Effect of nano oxide layer on exchange bias and GMR in Mn-Ir-Pt based spin valve
Creators
Description
We have investigated the effect of nano oxide layers (NOLs), which were fabricated by a plasma oxidation of CoFe layer on the magnetic properties and magneto-resistance (MR) in a Mn-Ir-Pt based spin valve. The adjusted NOL could result in the high MR and the strong exchange coupling field (Hex). From a high resolution electron microscopy analysis the oxide was about 1 nm. The strong reflectivity at the interface of a free and oxide capping layer should lead to the decrease of an interlayer coupling field, which could possibly improve the Hex
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2003.12.773;
- PII
- S0304885303016986;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 272-276
- Journal Issue
- 6
- Journal Page Range
- p. 1903-1904
- ISSN
- 0304-8853
- CODEN
- JMMMDC
Conference
- Title
- International conference on magnetism
- Acronym
- ICM 2003
- Dates
- 27 Jul - 1 Aug 2003
- Place
- Rome (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36025271
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COBALT COMPOUNDS; COUPLING; ELECTRON MICROSCOPY; INTERFACES; IRIDIUM COMPOUNDS; IRON COMPOUNDS; LAYERS; MAGNETIC PROPERTIES; MAGNETORESISTANCE; MANGANESE COMPOUNDS; NANOSTRUCTURES; OXIDATION; OXIDES; PLASMA; PLATINUM COMPOUNDS; REFLECTIVITY; SPIN
- Descriptors DEC
- ANGULAR MOMENTUM; CHALCOGENIDES; CHEMICAL REACTIONS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; MICROSCOPY; OPTICAL PROPERTIES; OXYGEN COMPOUNDS; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; SURFACE PROPERTIES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.