Orientation-dependent energy level alignment and film growth of 2,7-diocty[1]benzothieno[3,2-b]benzothiophene (C8-BTBT) on HOPG
Creators
- 1. Hunan Key Laboratory for Super-Microstructure and Ultrafast Process, School of Physics and Electronics, Central South University, Changsha, Hunan 410012 (China)
- 2. Institute of Super-Microstructure and Ultrafast Process in Advanced Materials, School of Physics and Electronics, Central South University, No. 605 Lushan South Road, Changsha, Hunan 410012 (China)
- 3. Department of Physics and Astronomy, University of Rochester, Rochester, New York 14627 (United States)
Description
Combining ultraviolet photoemission spectroscopy, X-ray photoemission spectroscopy, atomic force microscopy, and X-ray diffraction measurements, we performed a systematic investigation on the correlation of energy level alignment, film growth, and molecular orientation of 2,7-diocty[1]benzothieno[3,2-b]benzothiophene (C8-BTBT) on highly oriented pyrolytic graphite. The molecules lie down in the first layer and then stand up from the second layer. The ionization potential shows a sharp decrease from the lying down region to the standing up region. When C8-BTBT molecules start standing up, unconventional energy level band-bending-like shifts are observed as the film thickness increases. These shifts are ascribed to gradual decreasing of the molecular tilt angle about the substrate normal with the increasing film thickness
Additional details
Identifiers
- DOI
- 10.1063/1.4939839;
Publishing Information
- Journal Title
- Journal of Chemical Physics
- Journal Volume
- 144
- Journal Issue
- 3
- Journal Page Range
- p. 034701-034701.7
- ISSN
- 0021-9606
- CODEN
- JCPSA6
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47063805
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CORRELATIONS; ENERGY LEVELS; FILMS; GRAPHITE; LAYERS; MOLECULES; ORIENTATION; PHOTOELECTRON SPECTROSCOPY; POTENTIALS; SUBSTRATES; THIONAPHTHENES; THIOPHENE; ULTRAVIOLET RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- CARBON; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; HETEROCYCLIC COMPOUNDS; MICROSCOPY; MINERALS; NONMETALS; ORGANIC COMPOUNDS; ORGANIC SULFUR COMPOUNDS; RADIATIONS; SCATTERING; SPECTROSCOPY
Optional Information
- Notes
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