Improvement of spectra in XANES measurement using parametric x-ray radiation

The X-ray beam from the parametric X-ray radiation (PXR) generator system at the Laboratory for Electron Beam Research and Application (LEBRA) in Nihon University has been applied to the wavelength dispersive X-ray absorption fine structure (DXAFS) measurement. Difference in the spectral resolution of the X-ray absorption near edge structure (XANES) has been investigated in terms of the incident electron beam position on the PXR target crystal plate which had a partly wedge-shaped cross-section with symmetric plane on one side and asymmetric plane on the other. The result has shown a dependence of the resolution on the incident electron beam position. The FWHM of the diffraction curve at the second crystal has simultaneously changed, which means that the energy definition of the PXR beam has been dependent on the incident electron beam position; the spectral resolution of XANES has been improved at the position where the FWHM was narrow. (author)