The application of reaction 40Ar(p, γ)41K to the studying of profile distribution of ar in zirconium-based materials

A narrow resonances in proton induced nuclear reactions cross-sections are widely used to the reconstruction of depth profiles a number of elements from Li up to Ti, Cr and Ni. The similar technique was used in present work for determination of profiles of Ar in specimens of zirconium and alloy Zr 1% Nb. The results are presented of nondestructive analysis of argon depth distribution for six samples in surface layer up to 1000 A. The studied samples were preliminary irradiated by beam of ions of 40Ar+ with energy 20 keV. The total dose of implantation was estimated as 1.1·1017 ion/cm2 for itch sample. The part of samples was modified by application of special thermal and mechanical treatment. The nuclear resonance at 1101.8 keV with width of 90 eV from a reaction of radiation capture of proton 40Ar(p,γ)41K was used to obtain the argon profile in the zirconium matrices. g-quanta with energy 1582 keV were registered by large volume Ge(Li) detector and yield of theses quanta versus the energy/range of protons was employed to determine argon depth distribution in the samples studied. The integral doses of implanted ions were measured using the K-shell X-ray emission of argon.(authors)