Published 1999 | Version v1
Book

Computer simulation of defect production and behavior in displacement cascades in metals

Description

Recent research using molecular dynamics to simulate radiation damage due to displacement cascades in metals is reviewed. It includes results dealing with the effect on defect formation of primary knock-on atom energy and irradiation temperature. Clear dependencies and trends have emerged in these areas. In terms of the development of models to describe the evolution of radiation damage microstructure, the important parameters are not only the total number of Frenkel defects but also the distribution of their population in clusters and the form and mobility of these clusters. Results on these aspects are reviewed and it is shown that computer simulation is providing detailed information that paves the way for successful development of models of the evolution of damage beyond the stage of the cascade process

Additional details

Publishing Information

Publisher
Materials Research Society
Imprint Place
Warrendale, PA (United States)
ISBN
1-55899-444-0
Imprint Title
Multiscale modeling of materials. Materials Research Society symposium proceedings: Volume 538
Imprint Pagination
607 p.
Journal Page Range
p. 127-138
ISSN
0272-9172

Conference

Title
Multiscale Modeling of Materials
Dates
30 Nov - 3 Dec 1998
Place
Boston, MA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
31023833
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
COMPILED DATA; COMPUTERIZED SIMULATION; CRYSTAL DEFECTS; METALS; MOLECULAR DYNAMICS METHOD; PHYSICAL RADIATION EFFECTS; TEMPERATURE DEPENDENCE
Descriptors DEC
CALCULATION METHODS; CRYSTAL STRUCTURE; DATA; ELEMENTS; INFORMATION; NUMERICAL DATA; RADIATION EFFECTS; SIMULATION

Optional Information

Notes
Imprint:Single article reprints are available through University Microfilms Inc., 300 North Zeeb Rd., Ann Arbor, Michigan 48106 (US)