Published March 25, 2002 | Version v1
Journal article

Single-shot electron-beam bunch length measurements

  • 1. FOM Institute for Plasma Physics 'Rijnhuizen', Edisonbaan 14, 3439 MN Nieuwegein (Netherlands)
  • 2. School of Science and Engineering, University of Abertay Dundee, Bell Street, Dundee DD1 1HG (United Kingdom)
  • 3. Universitaet Hamburg, Institut fuer Angewandte Physik, Jungiusstrasse 11, 20355 Hamburg (Germany)

Description

We report subpicosecond electro-optic measurements of the length of individual relativistic electron bunches. The longitudinal electron-bunch shape is encoded electro-optically on to the spectrum of a chirped laser pulse. The electron-bunch length is determined by analyzing individual laser-pulse spectra obtained with and without the presence of an electron bunch. Since the length of the chirped laser pulse can be easily changed, the electron bunch can be visualized on different time scales. This single-shot imaging technique is a promising method for real-time electron-bunch diagnostics

Additional details

Publishing Information

Journal Title
Physical Review Letters
Journal Volume
88
Journal Issue
12
Journal Page Range
p. 124801-124801.4
ISSN
0031-9007
CODEN
PRLTAO

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35011147
Subject category
S43: PARTICLE ACCELERATORS;
Descriptors DEI
BEAM BUNCHING; BEAM PROFILES; ELECTRO-OPTICAL EFFECTS; ELECTROMAGNETIC PULSES; ELECTRON BEAMS; FREE ELECTRON LASERS; RELATIVISTIC RANGE
Descriptors DEC
BEAM DYNAMICS; BEAMS; DYNAMICS; ELECTROMAGNETIC RADIATION; ENERGY RANGE; LASERS; LEPTON BEAMS; MECHANICS; PARTICLE BEAMS; PULSES; RADIATIONS

Optional Information

Notes
(c) 2002 The American Physical Society