Published March 25, 2002
| Version v1
Journal article
Single-shot electron-beam bunch length measurements
Creators
- 1. FOM Institute for Plasma Physics 'Rijnhuizen', Edisonbaan 14, 3439 MN Nieuwegein (Netherlands)
- 2. School of Science and Engineering, University of Abertay Dundee, Bell Street, Dundee DD1 1HG (United Kingdom)
- 3. Universitaet Hamburg, Institut fuer Angewandte Physik, Jungiusstrasse 11, 20355 Hamburg (Germany)
Description
We report subpicosecond electro-optic measurements of the length of individual relativistic electron bunches. The longitudinal electron-bunch shape is encoded electro-optically on to the spectrum of a chirped laser pulse. The electron-bunch length is determined by analyzing individual laser-pulse spectra obtained with and without the presence of an electron bunch. Since the length of the chirped laser pulse can be easily changed, the electron bunch can be visualized on different time scales. This single-shot imaging technique is a promising method for real-time electron-bunch diagnostics
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review Letters
- Journal Volume
- 88
- Journal Issue
- 12
- Journal Page Range
- p. 124801-124801.4
- ISSN
- 0031-9007
- CODEN
- PRLTAO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35011147
- Subject category
- S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- BEAM BUNCHING; BEAM PROFILES; ELECTRO-OPTICAL EFFECTS; ELECTROMAGNETIC PULSES; ELECTRON BEAMS; FREE ELECTRON LASERS; RELATIVISTIC RANGE
- Descriptors DEC
- BEAM DYNAMICS; BEAMS; DYNAMICS; ELECTROMAGNETIC RADIATION; ENERGY RANGE; LASERS; LEPTON BEAMS; MECHANICS; PARTICLE BEAMS; PULSES; RADIATIONS
Optional Information
- Notes
- (c) 2002 The American Physical Society