Published 2013
| Version v1
Journal article
Scanning probe microscopy techniques for mechanical characterization at nanoscale
- 1. Department of Basic and Applied Sciences for Engineering, University of Rome Sapienza, and Electron Microscopies and Nanoscopies Laboratory, EMINA Lab., Rome (Italy)
- 2. Department of Molecular Biosciences and Bioengineering, University of Hawaii - Honolulu and Department of Mechanical Engineering, University of Hawaii - Honolulu (United States)
- 3. Department of Chemical Sciences and Technologies, University of Rome Tor Vergata, and Micro and Nano-structured Systems Laboratory -MINAS lab- Rome (Italy)
- 4. Centro di Ricerca per le Nanotecnologie Applicate all'Ingegneria della Sapienza (CNIS), University of Rome Sapienza, Rome (Italy)
Description
Three atomic force microscopy (AFM)-based techniques are reviewed that allow one to conduct accurate measurements of mechanical properties of either stiff or compliant materials at a nanometer scale. Atomic force acoustic microscopy, AFM-based depth sensing indentation, and torsional harmonic AFM are briefly described. Examples and results of quantitative characterization of stiff (an ultrathin SeSn film), soft polymeric (polyaniline fibers doped with detonation nanodiamond) and biological (collagen fibers) materials are reported.
Additional details
Publishing Information
- Journal Title
- Nuovo Cimento. C (Print)
- Journal Volume
- 36
- Journal Issue
- 2
- Journal Page Range
- p. 83-88
- ISSN
- 2037-4909
Conference
- Title
- 8. edition
- Acronym
- Nano forum 2012
- Dates
- 24-26 Sep 2012
- Place
- Rome (Italy)
INIS
- Country of Publication
- Italy
- Country of Input or Organization
- Italy
- INIS RN
- 44096000
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACOUSTICS; ATOMIC FORCE MICROSCOPY; MECHANICS; NANOSTRUCTURES; POLYMERS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; TECHNOLOGY UTILIZATION
- Descriptors DEC
- MATERIALS; MICROSCOPY