Published October 2006 | Version v1
Journal article

Design of Phase-shifting ESPI System for 3D Deformation Measurement

  • 1. Department of Precision Mechanical Engineering, Shanghai university No.149, Yanchang Rd., Shanghai, 200072 (China)
  • 2. Department of Communication Engineering, Shanghai University, Shanghai (China)

Description

It designs the phase-shifting ESPI(electronic speckle pattern interferometry) systems for 3D deformation measurement. The first design applies common optics, single laser source and two PZTs to introduce five testing beams, in which two beams are phase-shifted. By this system, in-plane and out-plane deformation can be tested by switching the projecting beams and 3D deformation of the object can be calculated. The testing is closely dynamic. The second design applies a one to five beam-splitting fiber to simply and compact the system. In this system, the laser beam is divided into five sub-beams as the testing rays. On the heads of two sub-fibers, PZTs are attached to introduce phase-shifting. By analysis, the system error by this phase-shifting mode can be omitted. In this system, the in-plane and out-plane deformation are tested by the same switching mode as the first design, which means that the dynamic characteristic is determined by the switching speed. It describes the two designs and analyzes briefly

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/48/911/jpconf6_48_173.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
48
Journal Issue
1
Journal Page Range
p. 911-915
ISSN
1742-6596

Conference

Title
International symposium on instrumentation science and technology
Dates
8-12 Aug 2006
Place
Harbin (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38033742
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM SPLITTING; DEFORMATION; DESIGN; INTERFEROMETRY; LASERS; OPTICAL FIBERS; OPTICS; PHASE SHIFT; TESTING
Descriptors DEC
FIBERS