Published August 22, 2011
| Version v1
Journal article
Large area quasi-free standing monolayer graphene on 3C-SiC(111)
- 1. Center for Nanotechnology Innovation and NEST, Istituto Italiano di Tecnologia, Piazza San Silvestro 12, 56127 Pisa (Italy)
- 2. Max-Planck-Institut fuer Festkoerperforschung, Heisenbergstr. 1, D-70569 Stuttgart (Germany)
- 3. MAX-Lab, Lund University, Box 118, Lund S-22100 (Sweden)
- 4. Laboratoire des Materiaux et du Genie Physique-CNRS UMR5628--Grenoble INP, Minatec 3 parvis Louis Neel, BP 257, 38016 Grenoble (France)
Description
Large scale, homogeneous quasi-free standing monolayer graphene is obtained on cubic silicon carbide, i.e., the 3C-SiC(111) surface, which represents an appealing and cost effective platform for graphene growth. The quasi-free monolayer is produced by intercalation of hydrogen under the interfacial, (6√(3)x6√(3))R30 deg.-reconstructed carbon layer. After intercalation, angle resolved photoemission spectroscopy reveals sharp linear π-bands. The decoupling of graphene from the substrate is identified by x-ray photoemission spectroscopy and low energy electron diffraction. Atomic force microscopy and low energy electron microscopy demonstrate that homogeneous monolayer domains extend over areas of hundreds of square-micrometers.
Additional details
Identifiers
- DOI
- 10.1063/1.3618674;
- arXiv
- arXiv:1109.6240v1;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 99
- Journal Issue
- 8
- Journal Page Range
- p. 081904-081904.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43115989
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTAL STRUCTURE; DECOUPLING; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; ELECTRONIC STRUCTURE; GRAPHITE; HYDROGEN; LAYERS; NANOSTRUCTURES; PHOTOEMISSION; SILICON CARBIDES; SUBSTRATES; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CARBIDES; CARBON; CARBON COMPOUNDS; COHERENT SCATTERING; DIFFRACTION; ELECTRON SPECTROSCOPY; ELEMENTS; EMISSION; MICROSCOPY; MINERALS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SECONDARY EMISSION; SILICON COMPOUNDS; SPECTROSCOPY
Optional Information
- Notes
- (c) 2011 American Institute of Physics