Published June 15, 2016 | Version v1
Journal article

Effect of GaN buffer polarization on electron distribution of AlGaN/GaN heterostructure

Description

The formation of 2DEG in AlGaN/GaN heterostructure is discussed in detail. A misunderstanding about the 2DEG sheet density expression is clarified. It is predicted by theoretical analysis and validated by self-consistent Schrodinger–Poisson numerical simulation that under the force of GaN polarization, large amounts of electrons will accumulate at the GaN/substrate interface in AlGaN/GaN/substrate HEMT structure. - Highlights: • The formation of 2DEG in AlGaN/GaN heterostructure is discussed in detail. • Self-consistent Schrodinger–Poisson numerical simulation is used to modulate the AlGaN/GaN/substrate structure. • It is predicted by that large amounts of electrons will accumulate at the GaN/substrate interface.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jallcom.2016.02.047

Additional details

Identifiers

DOI
10.1016/j.jallcom.2016.02.047;
PII
S0925-8388(16)30316-4;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
670
Journal Page Range
p. 258-261
ISSN
0925-8388
CODEN
JALCEU

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.