Published May 1978 | Version v1
Journal article

Dependence of shear stress of the LiF crystals on concentration of oriented dipoles

  • 1. AN Gruzinskoj SSR, Tbilisi. Inst. Fiziki

Description

Studied was the dependence of shear stress tau of LiF crystals irradiated by γ-rays in the electric field upon the field intensity and the radiation dose. It has been established that the concentration of oriented dipoles increases with the growth of field intensity which is being manifested by the growth in anisotropy of the mechanical properties along the crystallographic directions of the system < 110 >. The kinetics of recovering the properties of the crystals after removing the field has been studied. The activation energy involved in the process of re-orienting the dipoles has been estimated. It turned out to be equal to 0.5 eV

Additional details

Additional titles

Original title (Russian)
Зависимост' напряжения сдвига кристаллов LiF от концентрации ориентированных диполей

Publishing Information

Journal Title
Fiz. Tverd. Tela
Journal Volume
20
Journal Issue
5
Series
Fiz. Tverd. Tela.
Journal Page Range
1423-1425

Optional Information

Notes
For English translation see the journal Sov. Phys. - Solid State.