Published March 2021 | Version v1
Journal article Metadata-only

Growth and characterization of pyrochlore-type (Ca,Ti)2(Nb,Ti)2O7 thin films

Creators

  • 1. State Key Laboratory for Mechanical Behavior of Materials & School of Microelectronics, Xi'an Jiaotong University, Xi'an 710049 (China)
  • 2. Key Laboratory for Organic Electronics and Information Displays & Institute of Advanced Materials, Nanjing University of Posts & Telecommunications, Nanjing 210023 (China)
  • 3. Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 52425 Jülich (Germany)
  • 4. Department of Materials Science and Engineering, Southern University of Science and Technology, Shen Zhen 518055 (China)

Description

Highlights: • Pyrochlore-type (Ca,Ti)2(Nb,Ti)2O7 (CNTO) films have been obtained. • Cube-on-cube epitaxy occurs for the CNTO/yttria-stabilized zirconia system. • An interlayer of Ca1-□(Ti,Nb)O3 forms between CNTO film and LaAlO3 substrate. • The cation reconstruction appears at the CNTO/Ca1-□(Ti,Nb)O3 interface. Pyrochlore-type (Ca,Ti)2(Nb,Ti)2O7 thin films have been grown on single-crystalline LaAlO3 and yttria-stabilized zirconia substrates by a magnetron sputtering system. Atomic-scale interface structure and growth mode of the (Ca,Ti)2(Nb,Ti)2O7 films on the substrates with different crystal structures have been investigated by advanced electron microscopy techniques. In both heterosystems, the film/substrate orientation relationship of [100](001)film//[100](001)substrate has been determined. In the heterosystem of (Ca,Ti)2(Nb,Ti)2O7/yttria-stabilized zirconia, the films directly grow on the substrates. In contrast, in the (Ca,Ti)2(Nb,Ti)2O7/LaAlO3 heterosystem, a perovskite-type Ca1-□(Ti,Nb)O3 interlayer with a few unit cells in thickness forms at the interface and interfacial reconstruction occurs at the (Ca,Ti)2(Nb,Ti)2O7/Ca1-□(Ti,Nb)O3 interface. Our findings indicate that the formation of the interlayer and the (Ca,Ti)2(Nb,Ti)2O7/Ca1-□(Ti,Nb)O3 interface reconstruction can accommodate the film/substrate dissimilarities in the crystal structures and facilitate the growth of single-crystalline pyrochlore-type films on the perovskite-type substrates.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2021.138546

Additional details

Identifiers

DOI
10.1016/j.tsf.2021.138546;
PII
S0040609021000298;

Publishing Information

Journal Title
Thin Solid Films (Print)
Journal Volume
721
Journal Page Range
vp.
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Switzerland
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
54005146
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALUMINATES; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; EPITAXY; INTERFACES; LANTHANUM COMPOUNDS; MAGNETRONS; MONOCRYSTALS; OZONE; PEROVSKITE; PYROCHLORE; SPUTTERING; SUBSTRATES; THICKNESS; THIN FILMS; YTTRIUM OXIDES; ZIRCONIUM OXIDES
Descriptors DEC
ALUMINIUM COMPOUNDS; CHALCOGENIDES; CRYSTAL GROWTH METHODS; CRYSTALS; DIMENSIONS; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PEROVSKITES; RARE EARTH COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS; ZIRCONIUM COMPOUNDS

Optional Information

Copyright
Copyright (c) 2021 Elsevier B.V. All rights reserved.