Mechanical contact between rough surfaces at low load
Creators
- 1. Institute of Materials Research and Engineering, A-STAR (Agency for Science, Technology and Research), 3 Research Link, Singapore 117602 (Singapore)
Description
A model is developed to describe the initial contact between rough surfaces. The Greenwood-Williamson statistical approach is used with exponential or Weibull asperity height distributions, and modified with the relative displacement between the surfaces referenced to the initial contact of the highest asperity (within a given area) at zero load. This form provides a framework for investigating contact at low loads or contact over small area e.g. as found in microfabricated structures. The approach gives the expected number of asperities touching, the real area of contact and the normal force in terms of the indentation. The model results show that for hard surface materials (e.g. Silicon), very few asperities may be in contact at low loads (∼1 µN) even over large nominal surface areas (∼20 × 20 µm2), in accordance with observations drawn from microfabrication experiments. This suggests an analytical means to bridge nanoscale concepts and approaches (e.g. superlubricity, friction at a single asperity) to microscale structures.
Availability note (English)
Available from http://dx.doi.org/10.1088/0022-3727/45/47/475303Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 45
- Journal Issue
- 47
- Journal Page Range
- [15 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44040726
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- DISTRIBUTION; FRICTION; MATERIALS; SILICON; SIMULATION; SURFACE AREA; SURFACES
- Descriptors DEC
- ELEMENTS; SEMIMETALS; SURFACE PROPERTIES