Preparation and characterization of CoFe2O4 powders and films via the sol–gel method
- 1. School of Materials Science and Engineering, Hefei University of Technology, Hefei, Anhui 230009 (China)
Description
Highlights: ► We prepared the CFO materials via two sol-gel methods by selecting different chelators. ► We prepared CFO films using the CFO precursor solutions prepared by the better method. ► The CFO films with nano-scaled film thicknesses have good morphologies, clear layered structure and better magnetic properties than the CFO powders. - Abstract: The CoFe2O4 (CFO) starting precursor solutions were prepared by two sol–gel methods. The XRD results show that the second sol–gel method is a better method to obtain CFO materials with high purity. The CFO precursor solutions prepared by the second sol–gel method were spin-coated onto the Pt/Ti/SiO2/Si substrate to obtain CFO films. With the increase of annealing temperature, the relative amounts of secondary phases in CFO films are decreased. When annealed at 700 °C, CFO films are almost composed of the main phase and the substrate phase without secondary phases. The CFO film is crack-free and has compact structure without any pore. The thickness of CFO film is about 49 nm. The starting precursor solution with the concentration of 0.15 mol L−1 is better for preparing CFO films. The CFO films with nano-scaled film thicknesses have better magnetic properties than the CFO powders.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2011.09.057Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2011.09.057;
- PII
- S0925-8388(11)01875-5;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 512
- Journal Issue
- 1
- Journal Page Range
- p. 165-170
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43102699
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COBALT OXIDES; CRACKS; FILMS; IMPURITIES; MAGNETIC PROPERTIES; MATERIALS; MORPHOLOGY; POWDERS; PRECURSOR; SILICON OXIDES; SOL-GEL PROCESS; SOLUTIONS; SPIN; SUBSTRATES; THICKNESS; X-RAY DIFFRACTION
- Descriptors DEC
- ANGULAR MOMENTUM; CHALCOGENIDES; COBALT COMPOUNDS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; DISPERSIONS; HOMOGENEOUS MIXTURES; MIXTURES; OXIDES; OXYGEN COMPOUNDS; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; SCATTERING; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.