Published April 30, 2014 | Version v1
Journal article

Carrier extraction dynamics from Ge/Si quantum wells in Si solar cells

  • 1. PRESTO-JST, Kawaguchi, Saitama 332-0012 (Japan)
  • 2. Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011 (Japan)
  • 3. Graduate School of Engineering, Nagoya University, Nagoya, Aichi 464-8603 (Japan)
  • 4. Institute for Materials Research, Tohoku University, Sendai 980-8577 (Japan)

Description

To address the carrier extraction mechanism that determines the fundamental characteristics, such as current density, open circuit voltage, and fill factor in nanostructure-based solar cells, we performed photoluminescence (PL) decay measurements of the Ge/Si quantum wells (QWs) in crystalline-silicon (c-Si) solar cells. We found that the PL decay time of Ge/Si QWs depends on the temperature and the applied electric field; this dependence reflects the carrier separation characteristics of electron–hole pairs in Ge/Si QWs. Above ∼ 40 K, the electron–hole pairs are rapidly separated by the thermal excitation and the built-in electric field of c-Si solar cells. In contrast, at 20 K the PL decay time remains almost unchanged for an applied electric field of up to ± 1 V. These results indicate that the electrons confined in the type-II band offsets could be thermally excited and then extracted by an applied electric field. - Highlights: • Carrier extraction mechanism in nanostructure-based solar cells • Photoluminescence dynamics in Ge/Si quantum wells in Si solar cells • Carrier separation characteristics of electron-hole pairs in type-II Ge/Si QWs

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2013.08.042

Additional details

Identifiers

DOI
10.1016/j.tsf.2013.08.042;
PII
S0040-6090(13)01334-5;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
557
Journal Page Range
p. 368-371
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
8. international conference on silicon epitaxy and heterostructures; ISCSI-VI: 6. international symposium on control of semiconductor interfaces
Acronym
ICSI-8
Dates
2-6 Jun 2013
Place
Fukuoka (Japan)

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.