Published November 1994
| Version v1
Journal article
Fictitious sources in X-ray optics of defect crystals
Description
Using the formalism of fictitious sources, X-ray Laue diffraction in a wedge-shaped defect crystal is analyzed. Expressions for the aperture and period of interference are obtained. These parameters are shown to depend on the degree of perfection (the static Debye-Waller factor) of a periodic structure. A criterion for the interference pattern contrast with allowance for coherently and diffusely scattered intensity is given. 5 refs., 2 figs
Additional details
Publishing Information
- Journal Title
- Optics and Spectroscopy
- Journal Volume
- 77
- Journal Issue
- 5
- Journal Page Range
- p. 729-730.
- ISSN
- 0030-400X
- CODEN
- OPSUA3
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27043097
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Translation
- Descriptors DEI
- CRYSTAL DEFECTS; CRYSTAL LATTICES; OPTICS; SCATTERING; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION
Optional Information
- Notes
- Cover-to-cover Translation of Optika i Spektroskopiya (USSR); Translated from Optika i Spektroskopiya; 77: No. 5, 811-813(1994).