Noise reduction by sparse representation in learned dictionaries for application to blind tip reconstruction problem

Scanning probe microscopy (SPM) is a well known tool used for the investigation of phenomena in objects in the nanometer size range. However, quantitative results are limited by the size and the shape of the nanoprobe used in experiments. Blind tip reconstruction (BTR) is a very popular method used to reconstruct the upper boundary on the shape of the probe. This method is known to be very sensitive to all kinds of interference in the atomic force microscopy (AFM) image. Due to mathematical morphology calculus, the interference makes the BTR results biased rather than randomly disrupted. For this reason, the careful choice of methods used for image enhancement and denoising, as well as the shape of a calibration sample are very important. In the paper, the results of thorough investigations on the shape of a calibration standard are shown. A novel shape is proposed and a tool for the simulation of AFM images of this calibration standard was designed. It was shown that careful choice of the initial tip allows us to use images of hole structures to blindly reconstruct the shape of a probe. The simulator was used to test the impact of modern filtration algorithms on the BTR process. These techniques are based on sparse approximation with function dictionaries learned on the basis of an image itself. Various learning algorithms and parameters were tested to determine the optimal combination for sparse representation. It was observed that the strong reduction of noise does not guarantee strong reduction in reconstruction errors. It seems that further improvements will be possible by the combination of BTR and a noise reduction procedure. (paper)