Published March 2013 | Version v1
Journal article

A Bayesian approach for damage localization in plate-like structures using Lamb waves

Creators

  • 1. State Key Laboratory of Mechanics and Control of Mechanical Structures, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, People's Republic of China (China)

Description

This paper presents an investigation of the applicability of a Bayesian system identification theory for localizing damage in plate-like structures, while considering the uncertainties from modeling and measurement. Diagnostic Lamb waves are excited and received by a piezoelectric sensor network before and after damage to obtain scattered waves that contain characteristic information about the damage. After the time-of-flight (ToF) of the scattered waves in each actuator–sensor path is measured by a continuous wavelet transform (CWT), a Bayesian approach is developed to identify the damage location and wave velocity. By combining the prior information and the measured ToF data, Bayes' theorem is used to update the probability distributions of the parameters about the damage location and wave velocity. In particular, a Markov chain Monte Carlo (MCMC) method is employed for sampling the posterior distributions of the unknown parameters. A numerical study for an aluminum plate and experimental studies for a stiffened aluminum panel and a composite laminate are conducted to validate the proposed Bayesian damage localization approach. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0964-1726/22/3/035012

Additional details

Publishing Information

Journal Title
Smart Materials and Structures (Print)
Journal Volume
22
Journal Issue
3
Journal Page Range
[17 p.]
ISSN
0964-1726

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44126666
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALUMINIUM; DAMAGE; DISTRIBUTION; MARKOV PROCESS; MONTE CARLO METHOD; NUMERICAL ANALYSIS; PIEZOELECTRICITY; PROBABILITY; SENSORS; SIMULATION
Descriptors DEC
CALCULATION METHODS; ELECTRICITY; ELEMENTS; MATHEMATICS; METALS; STOCHASTIC PROCESSES