Published October 1998 | Version v1
Journal article Metadata-only

Atomic-resolution X-ray fluorescence holography of Zn (0.02 wt%) in a GaAs wafer

Creators

  • 1. Kyoto Univ. (Japan)

Description

no abstract available

Additional details

Publishing Information

Journal Title
Analytical Sciences
Journal Volume
14
Journal Issue
5
Journal Page Range
p. 987-990
ISSN
0910-6340

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
30016332
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
No Abstract
Descriptors DEI
ATOMS; DOPED MATERIALS; GALLIUM ARSENIDES; HOLOGRAPHY; IMAGES; RESOLUTION; SPRING-8 STORAGE RING; X-RAY FLUORESCENCE ANALYSIS; ZINC
Descriptors DEC
ARSENIC COMPOUNDS; ARSENIDES; CHEMICAL ANALYSIS; ELEMENTS; GALLIUM COMPOUNDS; MATERIALS; METALS; NONDESTRUCTIVE ANALYSIS; PNICTIDES; RADIATION SOURCES; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; X-RAY EMISSION ANALYSIS