Characterization of DEPFET pixel modules in the integration campaign of the Belle-II vertex detector in the DESY test beam

Published 2017 | Version v1

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Original title (German): Charakterisierung von DEPFET-Pixelmodulen in der Integrationskampagne des Belle-II Vertexdetektors im DESY-Teststrahl

Journal Title: Verhandlungen der Deutschen Physikalischen Gesellschaft
Journal Issue: Muenster 2017 issue
Series: Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 52(4)
Journal Page Range: [1 p.]
ISSN: 0420-0195
CODEN: VDPEAZ

Title: 81. Annual meeting of DPG and DPG Spring meeting 2017 of the divisions on hadronic and nuclear physics, radiation and medical physics, particle physics and the working groups on equal opportunities, energy, information, young DPG, physics and disarmament
Original Conference Title: 81. Jahrestagung der DPG und DPG-Fruehjahrstagung 2017 der Fachverbaende Physik der Hadronen und Kerne, Strahlen- und Medizinphysik, Teilchenphysik und Arbeitskreise Chancengleichheit, Energie, Industrie und Wirtschaft sowie der Arbeitsgruppen Information, junge DPG, Physik und Abruestung
Dates: 27-31 Mar 2017
Place: Muenster (Germany)

Country of Publication: Germany
Country of Input or Organization: Germany
INIS RN: 50000833
Subject category: S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator: Conference, No Abstract
Descriptors DEI: ELECTRON DETECTION; FIELD EFFECT TRANSISTORS; GEV RANGE 01-10; INTEGRATED CIRCUITS; MODULAR STRUCTURES; POSITION SENSITIVE DETECTORS; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS
Descriptors DEC: CHARGED PARTICLE DETECTION; DETECTION; ELECTRONIC CIRCUITS; ENERGY RANGE; GEV RANGE; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; TRANSISTORS