Published July 2001
| Version v1
Journal article
X-ray magnetic circular dichroism in Fe/NiO thin films
Description
The interface of thin films of Fe/NiO (1 0 0)-oriented single crystals was studied by X-ray magnetic circular dichroism (XMCD). Thin layers of Fe were removed by 'in situ' sputtering, followed by XMCD measurements, resulting in a depth profile. A decrease from the bulk value in the value of the Fe moment at the interface of Fe with the antiferromagnetic NiO(1 0 0) was observed
Additional details
Identifiers
- PII
- S0304885301002311;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 233
- Journal Issue
- 1-2
- Journal Page Range
- p. 74-77
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33044578
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANTIFERROMAGNETISM; FERROMAGNETISM; INTERFACES; IRON; MAGNETIC CIRCULAR DICHROISM; MAGNETIC MOMENTS; MONOCRYSTALS; NICKEL OXIDES; SPUTTERING; SYNCHROTRON RADIATION; THIN FILMS; X-RAY SPECTROSCOPY
- Descriptors DEC
- BREMSSTRAHLUNG; CHALCOGENIDES; CRYSTALS; DICHROISM; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; MAGNETISM; METALS; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.