Epitaxial growth of p-InAs on GaSb with intense terahertz emission under 1.55-μm femtosecond laser excitation
Creators
- 1. Condensed Matter Physics Laboratory, National Institute of Physics, University of the Philippines Diliman, Quezon City 1101, The (Philippines)
- 2. Materials Science and Engineering Program, University of the Philippines Diliman, Quezon City 1101, The (Philippines)
- 3. Ateneo De Manila University, Quezon City, The (Philippines)
- 4. De La Salle University, 2401 Taft Avenue, Manila 1004, The (Philippines)
Description
Highlights: • Faceted p-InAs film generated twice stronger terahertz signal than p-InAs bulk. • A growth interruption scheme to resolve adhesion issue of epilayer is demonstrated. • The photo-Dember THz emission is explained by a large effective surface area. • A wide THz bandwidth of p-InAs film suggests high-velocity photocarriers. • 1.55 μm fs laser-excited p-InAs film exhibits lower saturation fluence than bulk. - Abstract: We report the molecular beam epitaxy growth of high-quality p-InAs thin films evaluated in the context of 1.55 μm femtosecond laser-excited THz emission efficiency. The presence of p-InAs is confirmed via scanning electron microscopy and X-ray diffraction. Using a GaAs buffer layer, the epitaxial growth of p-InAs layers was successfully achieved. Initiating GaAs deposition by growth interruption, we find that GaAs adheres to the GaSb substrate and provides a quasi-planar surface for the subsequent layers. We also find a significant enhancement in the THz radiation intensity of p-InAs films that is approximately twice compared to that of bulk p-InAs for 1.55 μm wavelength.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2017.12.022Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2017.12.022;
- PII
- S0040609017309276;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 648
- Journal Page Range
- p. 46-49
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50035342
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ADHESION; COMPARATIVE EVALUATIONS; DEPOSITION; EMISSION; GALLIUM ANTIMONIDES; GALLIUM ARSENIDES; INDIUM ARSENIDES; LAYERS; MOLECULAR BEAM EPITAXY; SEMICONDUCTOR MATERIALS; SIGNALS; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ANTIMONIDES; ANTIMONY COMPOUNDS; ARSENIC COMPOUNDS; ARSENIDES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; EPITAXY; EVALUATION; FILMS; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; MATERIALS; PNICTIDES; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.