Metal-derived band gap states: Ti on GaAs(110)
- 1. IBM T.J. Watson Research Center, Yorktown Heights, New York 10598
Description
The emergence of filled and empty Ti-derived interface states in the band gap of GaAs has been observed for coverages as low as 0.03 monolayer with synchrotron radiation excited photoemission (XPS) and inverse photoemission (IPS) spectroscopies. The onset of the photoelectron threshold for filled states in the valence band spectra and of the IPE photon threshold for the empty states follow directly the position of the surface Fermi level in the band gap. The origin of these states is associated with the rehybridization of the Ti-3d electrons with the valence electrons of the Ga and As atoms of the interface. This notion is supported by XPS core level studies, which show the occurrence of exchange reactions between the Ti and Ga, and the out-diffusion of As and its reaction with Ti. Chemical rebonding at the interface, which produces bonding (filled) and nonbonding (empty) states, is thus the first demonstrable mechanism for Fermi level pinning and Schottky barrier formation
Additional details
Publishing Information
- Journal Title
- J. Vac. Sci. Technol., A
- Journal Volume
- 4
- Journal Issue
- 3
- Series
- J. Vac. Sci. Technol., A.
- Journal Page Range
- 874-878
- ISSN
- 0734-2101
- CODEN
- JVTAD
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17072135
- Subject category
- S36: MATERIALS SCIENCE; S42: ENGINEERING;
- Descriptors DEI
- CHEMICAL BONDS; ELECTRONIC STRUCTURE; ENERGY GAP; FABRICATION; FERMI LEVEL; GALLIUM ARSENIDES; INTERFACES; PHOTOEMISSION; SCHOTTKY BARRIER DIODES; SYNCHROTRON RADIATION; TITANIUM; VALENCE
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; ENERGY LEVELS; GALLIUM COMPOUNDS; METALS; RADIATIONS; SECONDARY EMISSION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TRANSITION ELEMENTS