Modern and historical engineering components investigated by neutron diffraction on ENGIN-X
- 1. ISIS, Rutherford Appleton Laboratory, Oxfordshire (United Kingdom)
- 2. Space Sciences Laboratory, University of California at Berkeley, Berkeley, CA (United States)
Description
The ENGIN-X beamline is mainly used to determine residual strains/stresses deep within the interior of bulk engineering components. It is mainly used by scientists and engineers for the development of modern engineering processes and structural integrity investigations. ENGIN-X diffraction and transmission mode can be a very useful tool to measure strain, phase transitions, texture and material composition in spatial resolution in historical or archaeological artifacts and modern materials. The complexity of the shapes and sizes of the samples measured on ENGIN-X varies significantly between experiments, and this required the development of better planning, simulation and control software, SScanSS. In this paper an overview of recent developments in strain scanning on ENGIN-X and a highlight of current scientific research are presented. (author)
Availability note (English)
Available from http://dx.doi.org/10.1299/jmmp.6.408Additional details
Identifiers
- DOI
- 10.1299/jmmp.6.408;
Publishing Information
- Journal Title
- Journal of Solid Mechanics and Materials Engineering
- Journal Volume
- 6
- Journal Issue
- 6
- Journal Page Range
- p. 408-418
- ISSN
- 1880-9871
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 48081711
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BEAM PULSERS; COMPUTER CODES; COMPUTERIZED SIMULATION; MODERATORS; NEUTRON DETECTORS; NEUTRON DIFFRACTION; NEUTRON FLUX; NEUTRON RADIOGRAPHY; RESIDUAL STRESSES; SCINTILLATION COUNTERS; SPATIAL RESOLUTION; STRAINS; TIME-OF-FLIGHT METHOD; WAVELENGTHS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; INDUSTRIAL RADIOGRAPHY; MATERIALS TESTING; MEASURING INSTRUMENTS; NONDESTRUCTIVE TESTING; RADIATION DETECTORS; RADIATION FLUX; RESOLUTION; SCATTERING; SIMULATION; STRESSES; TESTING
Optional Information
- Notes
- 38 refs., 7 figs.