Published October 15, 1993
| Version v1
Journal article
Spatial resolution of silicon microstrip detectors
Description
The spatial resolution of silicon microstrip detectors is studied as a function of the main detector parameters and of the track angle. Several algorithms for finding the position of particle bits are presented and analysed. Analytic expressions of the spatial resolution are derived for the main algorithms. Using a Monte Carlo simulation, the spatial resolution is calculated for each algorithm and, for each detector design and track geometry, the algorithm that gives the best resolution is determined. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 335
- Journal Issue
- 1-2
- Journal Page Range
- p. 44-58.
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 25011195
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALGORITHMS; ANISOTROPY; BACKGROUND NOISE; CHARGE COLLECTION; CHARGE TRANSPORT; CHARGED PARTICLE DETECTION; COMPUTERIZED SIMULATION; DIFFUSION; EFFICIENCY; EQUIVALENT CIRCUITS; GEOMETRY; MONTE CARLO METHOD; N-TYPE CONDUCTORS; NONLINEAR PROBLEMS; ONE-DIMENSIONAL CALCULATIONS; P-N JUNCTIONS; P-TYPE CONDUCTORS; PARTICLE TRACKS; POSITION SENSITIVE DETECTORS; PREAMPLIFIERS; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS; SILICON; SPATIAL RESOLUTION
- Descriptors DEC
- AMPLIFIERS; CALCULATION METHODS; DETECTION; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; MATERIALS; MATHEMATICS; MEASURING INSTRUMENTS; NOISE; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR JUNCTIONS; SEMICONDUCTOR MATERIALS; SEMIMETALS; SIMULATION