Published 2014
| Version v1
Miscellaneous
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Pulsed bias effect on TiO2[Nb] films deposited by grid assisted magnetron sputtering
Creators
- 1. Universidade do Estado de Santa Catarina (UESC), Joinville, SC (Brazil)
Description
Applying a pulsed negative bias to the substrate is a method used to change the energy of the ions reaching the substrate surface in sputtering processes. This allows, for example, the change of the crystalline structure of the deposited film. The control of the ion energy can be achieved by setting the duty cycle, voltage and frequency of the switched power supply. In the case of TiO2 film deposition, a higher energy favours the formation of rutile. This work shows some relationships between the substrate bias parameters and the crystalline formation in a DC triode magnetron sputtering. (author)
Files
51083421.pdf
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(1.1 MB)
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Additional details
Publishing Information
- Imprint Pagination
- 3 p.
- Report number
- INIS-BR--23066
Conference
- Title
- 13. Brazilian SBPMat meeting
- Dates
- 28 Sep - 2 Oct 2014
- Place
- Joao Pessoa, PB (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 51083421
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; DEPOSITION; MAGNETRONS; MICROSTRUCTURE; POWER SUPPLIES; SPUTTERING; STAINLESS STEELS; SUBSTRATES; THIN FILMS; TITANIUM OXIDES; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; CHALCOGENIDES; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; HIGH ALLOY STEELS; IRON ALLOYS; IRON BASE ALLOYS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; STEELS; TITANIUM COMPOUNDS; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS; X-RAY EMISSION ANALYSIS