Published June 15, 2008 | Version v1
Journal article

Three-dimensional visualization of ductile fracture in an Al-Si alloy by high-resolution synchrotron X-ray microtomography

  • 1. Toyohashi University of Technology, Department of Production Systems Engineering, Toyohashi 441-8580 (Japan)
  • 2. Japan Synchrotron Radiation Research Institute, Sayo, Hyogo 679-5198 (Japan)

Description

A direct three-dimensional visualization of the ductile fracture process under monotonic loading, in an Al-Si-Mg alloy specimen containing a fatigue pre-crack, has been conducted by means of the high-resolution X-ray computed tomography. Different morphology features of the crack viewed on different cross sections within the bulk of the specimen are detected. The isolated voids are distinguished from the microcracks. The evolution of the crack and voids as a function of the applied load are monitored and analyzed three-dimensionally. The advantages of the technique over traditional cross sectional observations are demonstrated, which facilitates to understand the fracture mechanisms in ductile materials, and to elucidate the fracture/microstructure interaction in non-uniform mediums

Availability note (English)

Available from http://dx.doi.org/10.1016/j.msea.2006.10.201

Additional details

Identifiers

DOI
10.1016/j.msea.2006.10.201;
PII
S0921-5093(07)00856-8;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
483-484
Journal Page Range
p. 293-296
ISSN
0921-5093
CODEN
MSAPE3

Conference

Title
14. international conference on the strength of materials
Dates
4-9 Jun 2006
Place
Xian (China)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40025497
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM ALLOYS; COMPUTERIZED TOMOGRAPHY; CRACK PROPAGATION; CRACKS; CROSS SECTIONS; FATIGUE; FRACTURES; MICROSTRUCTURE; MORPHOLOGY; SILICON ALLOYS; VOIDS; X RADIATION
Descriptors DEC
ALLOYS; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; FAILURES; IONIZING RADIATIONS; MECHANICAL PROPERTIES; RADIATIONS; TOMOGRAPHY

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.