Three-dimensional visualization of ductile fracture in an Al-Si alloy by high-resolution synchrotron X-ray microtomography
- 1. Toyohashi University of Technology, Department of Production Systems Engineering, Toyohashi 441-8580 (Japan)
- 2. Japan Synchrotron Radiation Research Institute, Sayo, Hyogo 679-5198 (Japan)
Description
A direct three-dimensional visualization of the ductile fracture process under monotonic loading, in an Al-Si-Mg alloy specimen containing a fatigue pre-crack, has been conducted by means of the high-resolution X-ray computed tomography. Different morphology features of the crack viewed on different cross sections within the bulk of the specimen are detected. The isolated voids are distinguished from the microcracks. The evolution of the crack and voids as a function of the applied load are monitored and analyzed three-dimensionally. The advantages of the technique over traditional cross sectional observations are demonstrated, which facilitates to understand the fracture mechanisms in ductile materials, and to elucidate the fracture/microstructure interaction in non-uniform mediums
Availability note (English)
Available from http://dx.doi.org/10.1016/j.msea.2006.10.201Additional details
Identifiers
- DOI
- 10.1016/j.msea.2006.10.201;
- PII
- S0921-5093(07)00856-8;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 483-484
- Journal Page Range
- p. 293-296
- ISSN
- 0921-5093
- CODEN
- MSAPE3
Conference
- Title
- 14. international conference on the strength of materials
- Dates
- 4-9 Jun 2006
- Place
- Xian (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40025497
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM ALLOYS; COMPUTERIZED TOMOGRAPHY; CRACK PROPAGATION; CRACKS; CROSS SECTIONS; FATIGUE; FRACTURES; MICROSTRUCTURE; MORPHOLOGY; SILICON ALLOYS; VOIDS; X RADIATION
- Descriptors DEC
- ALLOYS; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; FAILURES; IONIZING RADIATIONS; MECHANICAL PROPERTIES; RADIATIONS; TOMOGRAPHY
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.