Published April 2013 | Version v1
Journal article

Effect of the Ni81Fe19 thickness on the magnetic properties of Ni81Fe19/Fe50Co50 bilayers

  • 1. Department of Materials Science and Engineering, University of Sheffield, Sheffield S1 3JD (United Kingdom)
  • 2. Department of Physics, University of the Punjab, Quaid-i-Azam Campus, Lahore 54590 (Pakistan)

Description

The effect of the Ni81Fe19 layer thickness on the magnetic and microstructural properties of Ni81Fe19/Fe50Co50 bilayers has been studied. The thickness of the Fe50Co50 layer was held constant at 15 nm, while the Ni81Fe19 layer thickness increased from 15 nm to 90 nm. This meant that the Fe50Co50 layer plus the top of the Ni81Fe19 layer were measured using a magneto-optic Kerr effect magnetometer as the laser skin depth is of the order of 20 nm. It was found that as the Ni81Fe19 layer increased in thickness the coercive and saturation fields of the bilayer structure decreased, while the effective saturation magnetostriction constant increased, towards the Fe50Co50 bulk effective saturation magnetostriction value. -- Highlights: ► Magnetostriction of 15 nm FeCo on Si is dominated by a strong interface effect ► Using a NiFe underlayer, the interface effect between the FeCo and Si is removed. ► FeCo magnetostriction constant tends towards the bulk value as the NiFe thickness increases

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jmmm.2012.11.022

Additional details

Identifiers

DOI
10.1016/j.jmmm.2012.11.022;
PII
S0304-8853(12)00925-0;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
331
Journal Issue
Complete
Journal Page Range
p. 67-71
ISSN
0304-8853
CODEN
JMMMDC

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45096492
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
KERR EFFECT; LAYERS; MAGNETOSTRICTION; MICROSTRUCTURE; THICKNESS; THIN FILMS
Descriptors DEC
DIELECTRIC PROPERTIES; DIMENSIONS; ELECTRICAL PROPERTIES; FILMS; MAGNETIC PROPERTIES; PHYSICAL PROPERTIES

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.