Published December 1992 | Version v1
Report Restricted

Submillimeter and microwave residual losses in epitaxial films of Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O

  • 1. Lawrence Livermore National Lab., CA (United States)
  • 2. Stanford Univ., CA (United States). Dept. of Applied Physics
  • 3. Conductus, Inc., Sunnyvale, CA (United States)
  • 4. Bell Communications Research, Inc., Red Bank, NJ (United States)
  • 5. Sandia National Labs., Albuquerque, NM (United States)
  • 6. IBM Research Div., San Jose, CA (United States). Almaden Research Center
  • 7. Superconductor Technologies, Inc., Santa Barbara, CA (United States)

Description

We have used a novel bolometric technique and a resonant technique to obtain accurate submillimeter and microwave residual loss data for epitaxial thin films of YBa2Cu3O7, Tl2Ca2Ba2Cu3O10 and Tl2CaBa2Cu2O8. For all films we obtain good agreement between the submillimeter and microwave data, with the residual losses in both the Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O films scaling approximately as frequency squared below ∼ 1 THz. We are able to fit the losses in the Y-Ba-Cu-O films to a two fluid and a weakly coupled grain model for the a-b planeconductivity, in good agreement with results from a Kramers-Kronig analysis of the loss data

Availability note (English)

MF available from INIS under the Report Number; OSTI as DE93010430; NTIS; INIS; US Govt. Printing Office Dep.

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Additional details

Publishing Information

Imprint Pagination
2 p.
Report number
LBL--33557

Conference

Title
17. annual Society of Photo-Optical Instrumentation Engineers (SPIE) international conference on infrared and millimeter wave sources.
Dates
14-18 Dec 1992.
Place
Pasadena, CA (United States).