Novel 3-D free-form surface profilometry for reverse engineering
Creators
- 1. Graduate Institute of Automation Technology, National Taipei University of Technology, 1 Sec. 3 Chung-Hsiao East Rd, Taipei, 106, Taiwan (China)
Description
This article proposes an innovative 3-D surface contouring approach for automatic and accurate free-form surface reconstruction using a sensor integration concept. The study addresses a critical problem in accurate measurement of free-form surfaces by developing an automatic reconstruction approach. Unacceptable measuring accuracy issues are mainly due to the errors arising from the use of inadequate measuring strategies, ending up with inaccurate digitised data and costly post-data processing in Reverse Engineering (RE). This article is thus aimed to develop automatic digitising strategies for ensuring surface reconstruction efficiency, as well as accuracy. The developed approach consists of two main stages, namely the rapid shape identification (RSI) and the automated laser scanning (ALS) for completing 3-D surface profilometry. This developed approach effectively utilises the advantages of on-line geometric information to evaluate the degree of satisfaction of user-defined digitising accuracy under a triangular topological patch. An industrial case study was used to attest the feasibility of the approach
Availability note (English)
Available online at http://stacks.iop.org/1742-6596/13/174/jpconf5_13_041.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 13
- Journal Issue
- 1
- Journal Page Range
- p. 174-177
- ISSN
- 1742-6596
Conference
- Title
- 7. international symposium on measurement technology and intelligent instruments
- Dates
- 6-8 Sep 2005
- Place
- Huddersfield (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36111538
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; DATA PROCESSING; EFFICIENCY; ENGINEERING; ERRORS; LASERS; MEASURING METHODS; SURFACES; TOPOLOGY
- Descriptors DEC
- MATHEMATICS; PROCESSING