Published 1989 | Version v1
Book Metadata-only

Electron microscope characterization of the structures of high-Tc superconductors

Creators

  • 1. Dept. of Materials Science and Engineering, National Tsing Hau Univ., Taiwan (China)
  • 2. Materials Research Lab., Industrial Technology Research Inst., Hsinchu, Taiwan (China)

Description

An overview of structural characterization of high-Tc superconductors are presented. Various techniques for the determination of the structure are described. Examples of the characterization of high-Tc superconductors are provided mainly from electron microscope characterization of Y-Ba-Cu-O and Bi- and Tl-containing compounds

Additional details

Publishing Information

Publisher
World Scientific Pub. Co.
Imprint Place
Teaneck, NJ (United States)
ISBN
9971-50-953-9
Imprint Title
Superconductivity and applications
Imprint Pagination
460 p.
Journal Page Range
p. 63-78.

Conference

Title
superconductivity and applications.
Acronym
Taiwan international symposium on superconductivity
Dates
17-19 Apr 1989.
Place
Hsinchu, Taiwan (China).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
23021153
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON MICROSCOPY; HIGH-TC SUPERCONDUCTORS; MICROSTRUCTURE; SUPERCONDUCTIVITY; TECHNOLOGY ASSESSMENT; THALLIUM COMPOUNDS; YTTRIUM COMPOUNDS
Descriptors DEC
CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; MICROSCOPY; PHYSICAL PROPERTIES; SUPERCONDUCTORS; TRANSITION ELEMENT COMPOUNDS

Optional Information

Secondary number(s)
CONF-8904419--.