Widening the dynamic range of detectable indium content using the group of analytical lines

The problem of the quantitative chemical determination of the doping indium addition in a semiconducting material matrix (lead telluride) is solid using an atom emitting facility with an arc discharge of alternating current and introduction of power samples to spectrum excitation source with an air flow. Methods of direct determination of In content in a wide range of concentrations (from 4.0 x 10-4 to 15 mass%) are developed. (author)