Published August 15, 2008 | Version v1
Journal article

Dispersion and field emission properties of multi-walled carbon nanotubes by high-energy milling

  • 1. School of Materials Science and Engineering, Yeungnam University, Gyeongsan 712-749 (Korea, Republic of)
  • 2. Electric Material Development Team, Corporate R and D Center, Samsung SDI, Yong-in 449-577 (Korea, Republic of)

Description

Multi-walled carbon nanotubes (MWNTs) were high-energy milled for 2 h in texanol after a polycarboxylic acid polymeric dispersant had been added in order to enhance the dispersion. The degree of MWNT dispersion was significantly enhanced by high-energy milling compared to the intact sample, which increased the density of surface-exposed MWNTs with a screen-printed paste. However, the emission properties of high-energy milled MWNTs did not show such a high emission current density relative to their increased surface-exposed density. Further investigation using Raman spectroscopy and X-ray diffraction evidenced the milling-induced MWNT damage, which explained the relatively lower emission current density of high-energy milled MWNTs

Availability note (English)

Available from http://dx.doi.org/10.1016/j.matchemphys.2008.02.016

Additional details

Identifiers

DOI
10.1016/j.matchemphys.2008.02.016;
PII
S0254-0584(08)00086-2;

Publishing Information

Journal Title
Materials Chemistry and Physics
Journal Volume
110
Journal Issue
2-3
Journal Page Range
p. 363-369
ISSN
0254-0584
CODEN
MCHPDR

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40019713
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CARBON; CURRENT DENSITY; DISPERSIONS; FIELD EMISSION; NANOTUBES; RAMAN SPECTROSCOPY; SURFACES; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELEMENTS; EMISSION; LASER SPECTROSCOPY; NANOSTRUCTURES; NONMETALS; SCATTERING; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.