SIMION PC/PS2 electrostatic lens design program
Creators
- 1. Idaho National Engineering Laboratory, EG ampersand G Idaho, POB 1625 Idaho Falls, Idaho 83415 (USA)
Description
SIMION PC/PS2 4.02 is a personal computer program for designing and analyzing charged particle (ions and electrons) lenses, ion transport systems, and various types of mass spectrometers and surface probes that utilize charged particles. The modification of an existing design or the generation of a completely new one is performed interactively with a graphics screen and mouse. Once the geometry has been defined, the operating conditions (electrode voltages and magnetic field configuration) can be quickly changed and the resultant fields viewed in several different 2D and 3D modes. The trajectories of charged particles moving in these fields are calculated utilizing sophisticated ''look-ahead'' algorithms that dynamically control the time step to optimize speed and accuracy. A unique graphics display of the electrostatic fields and ion trajectories gives the user an intuitive, easily understood view of the performance characteristics. SIMION also includes a totally integrated capability for users to easily construct subprograms, which are automatically compiled and integrated into the main program, for defining and controlling all of the major functions of trajectory calculations. This makes it possible to model dynamic electric fields (e.g., rf), including ion-molecule collisions or neutralizations, etc. Operational experience with specific ion lenses designed with SIMION and tested in several different applications are discussed. SIMION PC/PS2 is available upon written request for the cost of distribution
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 61
- Journal Issue
- 1
- Series
- Rev. Sci. Instrum.
- Journal Page Range
- 607-609
- ISSN
- 0034-6748
- CODEN
- RSINA
Conference
- Title
- International conference on ion sources.
- Dates
- 10-14 Jul 1989.
- Place
- Berkeley, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21055101
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S99: GENERAL AND MISCELLANEOUS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM DYNAMICS; CHARGED-PARTICLE TRANSPORT; COMPUTER-AIDED DESIGN; COMPUTERIZED SIMULATION; ELECTROSTATIC LENSES; ION BEAMS; MASS SPECTROMETERS; MICROCOMPUTERS; S CODES
- Descriptors DEC
- BEAMS; COMPUTER CODES; COMPUTERS; DIGITAL COMPUTERS; DYNAMICS; LENSES; MEASURING INSTRUMENTS; MECHANICS; RADIATION TRANSPORT; SIMULATION; SPECTROMETERS
Optional Information
- Secondary number(s)
- CONF-890703--.