Published May 2008 | Version v1
Journal article

Ion beam induced luminescence on white inorganic pigments for paintings

  • 1. Laboratori Nazionali di Legnaro - INFN, Via Universita 2, I-35020 Legnaro, Padova (Italy)
  • 2. Universita di Trento, Dipartimento di Ingegneria dei Materiali e delle Tecnologie Industriali (DIMTI), Via Mesiano 77, I-38050 Povo, Trento (Italy)
  • 3. Centre de Recherche et de Restauration des Musees de France, CNRS UMR 171, Rue des Pyramides, 75041 Paris Cedex 01 (France)

Description

Ion beam induced luminescence (IBIL) has been used for studying the emission features and the radiation hardness of white pigments. In particular, ZnO, gypsum and basic lead sulphate pigments have been analyzed with a 3.0 MeV H+ beam at the AGLAE Louvre laboratory. The same pigments mixed with different binders have been also analyzed on a canvas, in order to evaluate the contribution of the binders both to the IBIL spectra and to the radiation hardness. It turns out that the binder affects both the IBIL spectra and the radiation hardness of pigments when the emission bands are related to point defects, as occurs for ZnO

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2008.03.009

Additional details

Identifiers

DOI
10.1016/j.nimb.2008.03.009;
PII
S0168-583X(08)00256-5;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
266
Journal Issue
10
Journal Page Range
p. 2301-2305
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
9. European conference on accelerators in applied research and technology
Acronym
ECAART-9
Dates
3-7 Sep 2007
Place
Florence (Italy)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40009542
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CULTURAL OBJECTS; HYDROGEN IONS 1 PLUS; ION BEAMS; LUMINESCENCE; PIGMENTS; PIXE ANALYSIS; POINT DEFECTS; SULFATES; ZINC OXIDES
Descriptors DEC
BEAMS; CATIONS; CHALCOGENIDES; CHARGED PARTICLES; CHEMICAL ANALYSIS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; EMISSION; HYDROGEN IONS; IONS; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; SULFUR COMPOUNDS; X-RAY EMISSION ANALYSIS; ZINC COMPOUNDS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.